APC Conference 2015 addresses complex Advanced Process Control needs and solutions for semiconductor manufacturers and those in related industries.
As manufacturing processes become more complex with greater yield and cost objectives, it has become vital to reimagine methods to increase productivity and quality. Semiconductor, photovoltaic, display, MEMS, LED and other industries are experiencing unparalleled cost/quality pressures. These objectives have made Advanced Process Control (APC) absolutely critical for profitable manufacturing.
APC Conference 2015 is built around topics such as fault detection and classification (FDC) and fault prediction (FP); manufacturing execution systems (MES) and their integration with APC; big data, data mining, real-time data collection and management; and run-to-run, wafer-to-wafer, model-based and real-time control.